IEEE

Impact of Strain on Sub-3 nm Gate-All-Around CMOS Logic Circuit Performance Using a Neural Compact Modeling Approach

Abstract: Impact of strain of sub-3 nm gate-all-around (GAA) CMOS transistors on the circuit performance is evaluated using a neural compact model. The model was trained using 3D technology ...
Bristol Post

Bus gates moved but East Bristol Liveable Neighbourhood continues

Some of the key aspects of the controversial East Bristol Liveable Neighbourhood are being scrapped but the scheme remains in place. Bristol City Council has announced some of the bus gates, bollards ...
IEEE

Gate Length Dependence of Bias Temperature Instabilities up to 400 °C in 4H-SiC CMOS Devices

Abstract: This letter reports the bias temperature instabilities (BTI) of 4H-SiC CMOS devices with different gate lengths (L) and gate widths (W) for integrated circuits at 400 °C for the first time.