Review of Methodologies for Evaluating Short-Circuit Robustness and Reliability of SiC Power MOSFETs
Abstract: To accelerate the broad application of silicon carbide (SiC) power MOSFETs, their short-circuit (SC) robustness and reliability must be thoroughly evaluated. This article, therefore, ...
Abstract: Internal short circuit (ISC) fault diagnosis of battery packs in electric vehicles is of great significance for the effective and safe operation of battery systems. This article presents a ...
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