Also known as surface potential microscopy, Kelvin probe force microscopy (KPFM) is one method in the range of electrical characterization techniques available in atomic force microscopes. The contact ...
(Nanowerk Spotlight – Application Note) Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is one member of a suite of electrical characterization methods available in ...
Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential. Compared to other modes ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback